Technostress and Insulin Resistance Risk: A Cross-Sectional Analysis of 104,175 Spanish Workers Using TyG, TyG-BMI, METS-IR, and SPISE Indices.
Medical sciences (Basel, Switzerland) · 2026
Abstract e pubblicazione originale
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Leggi nella fonte originale ↗Parole chiave
HumansInsulin ResistanceCross-Sectional StudiesMaleSpainTriglyceridesFemaleBody Mass IndexAdultMiddle AgedBlood GlucoseRisk FactorsOccupational HealthSurveys and Questionnairesinsulin resistancemetabolic score for insulin resistance (METS-IR)occupational healthsingle-point insulin sensitivity estimator (SPISE)technostresstriglyceride–glucose (TyG) indextriglyceride–glucose body mass index (TyG-BMI)
Come citare questo studio
Marta González Rivas, Ángel Arturo López-González, Diego González Carrasco, Carla Busquets-Cortés, María Teófila Vicente-Herrero, José Ignacio Ramírez-Manent. (2026). Technostress and Insulin Resistance Risk: A Cross-Sectional Analysis of 104,175 Spanish Workers Using TyG, TyG-BMI, METS-IR, and SPISE Indices.. Medical sciences (Basel, Switzerland). DOI: 10.3390/medsci14050545
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